Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations - researchr publication authors

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Amit Karel, Mariane Comte, Jean Marc Gallière, Florence Azaïs, Michel Renovell. Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2016, Pittsburgh, PA, USA, July 11-13, 2016. pages 164-169, IEEE, 2016. [doi]

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