Leonid Karlinsky, Joseph Shtok, Sivan Harary, Eli Schwartz, Amit Aides, Rogério Schmidt Feris, Raja Giryes, Alexander M. Bronstein. RepMet: Representative-Based Metric Learning for Classification and Few-Shot Object Detection. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019. pages 5197-5206, Computer Vision Foundation / IEEE, 2019. [doi]
@inproceedings{KarlinskySHSAFG19,
title = {RepMet: Representative-Based Metric Learning for Classification and Few-Shot Object Detection},
author = {Leonid Karlinsky and Joseph Shtok and Sivan Harary and Eli Schwartz and Amit Aides and Rogério Schmidt Feris and Raja Giryes and Alexander M. Bronstein},
year = {2019},
url = {http://openaccess.thecvf.com/content_CVPR_2019/html/Karlinsky_RepMet_Representative-Based_Metric_Learning_for_Classification_and_Few-Shot_Object_Detection_CVPR_2019_paper.html},
researchr = {https://researchr.org/publication/KarlinskySHSAFG19},
cites = {0},
citedby = {0},
pages = {5197-5206},
booktitle = {IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019},
publisher = {Computer Vision Foundation / IEEE},
}