Leonid Karlinsky, Joseph Shtok, Sivan Harary, Eli Schwartz, Amit Aides, Rogério Schmidt Feris, Raja Giryes, Alexander M. Bronstein. RepMet: Representative-Based Metric Learning for Classification and Few-Shot Object Detection. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019. pages 5197-5206, Computer Vision Foundation / IEEE, 2019. [doi]
Abstract is missing.