Rajit Karmakar, Santanu Chattopadhyay. Thermal-Aware Test Data Compression Using Dictionary Based Coding. In 28th International Conference on VLSI Design, VLSID 2015, Bangalore, India, January 3-7, 2015. pages 53-58, IEEE Computer Society, 2015. [doi]
@inproceedings{KarmakarC15,
title = {Thermal-Aware Test Data Compression Using Dictionary Based Coding},
author = {Rajit Karmakar and Santanu Chattopadhyay},
year = {2015},
doi = {10.1109/VLSID.2015.14},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2015.14},
researchr = {https://researchr.org/publication/KarmakarC15},
cites = {0},
citedby = {0},
pages = {53-58},
booktitle = {28th International Conference on VLSI Design, VLSID 2015, Bangalore, India, January 3-7, 2015},
publisher = {IEEE Computer Society},
isbn = {978-1-4799-6658-5},
}