P. Karpodinis, Dimitri Kagaris, Dimitris Nikolos. Accumulator based Test-per-Scan BIST. In 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal. pages 193-198, IEEE Computer Society, 2004. [doi]
Abstract is missing.