Built-in self-diagnostic by space-time compression of test responses

Mark G. Karpovsky, Saeed M. Chaudhry. Built-in self-diagnostic by space-time compression of test responses. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 149-154, IEEE, 1992. [doi]

Authors

Mark G. Karpovsky

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Saeed M. Chaudhry

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