Built-in self-diagnostic by space-time compression of test responses

Mark G. Karpovsky, Saeed M. Chaudhry. Built-in self-diagnostic by space-time compression of test responses. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 149-154, IEEE, 1992. [doi]

Abstract

Abstract is missing.