J. S. Karppinen, J. Li, J. Pakarinen, Toni T. Mattila, Mervi Paulasto-Kröckel. Shock impact reliability characterization of a handheld product in accelerated tests and use environment. Microelectronics Reliability, 52(1):190-198, 2012. [doi]
@article{KarppinenLPMP12,
title = {Shock impact reliability characterization of a handheld product in accelerated tests and use environment},
author = {J. S. Karppinen and J. Li and J. Pakarinen and Toni T. Mattila and Mervi Paulasto-Kröckel},
year = {2012},
doi = {10.1016/j.microrel.2011.09.001},
url = {http://dx.doi.org/10.1016/j.microrel.2011.09.001},
researchr = {https://researchr.org/publication/KarppinenLPMP12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {1},
pages = {190-198},
}