Shock impact reliability characterization of a handheld product in accelerated tests and use environment

J. S. Karppinen, J. Li, J. Pakarinen, Toni T. Mattila, Mervi Paulasto-Kröckel. Shock impact reliability characterization of a handheld product in accelerated tests and use environment. Microelectronics Reliability, 52(1):190-198, 2012. [doi]

Abstract

Abstract is missing.