Anton Karputkin, Raimund Ubar, Mati Tombak, Jaan Raik. Probabilistic equivalence checking based on high-level decision diagrams. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 423-428, IEEE, 2011. [doi]
Abstract is missing.