Sai Anirudh Karre, Y. Raghu Reddy. A Defect Dependency based Approach to Improve Software Quality in Integrated Software Products. In Joaquim Filipe, Leszek A. Maciaszek, editors, ENASE 2015 - Proceedings of the 10th International Conference on Evaluation of Novel Approaches to Software Engineering, Barcelona, Spain, 29-30 April, 2015. pages 110-117, SciTePress, 2015. [doi]
@inproceedings{KarreR15,
title = {A Defect Dependency based Approach to Improve Software Quality in Integrated Software Products},
author = {Sai Anirudh Karre and Y. Raghu Reddy},
year = {2015},
doi = {10.5220/0005368801100117},
url = {http://dx.doi.org/10.5220/0005368801100117},
researchr = {https://researchr.org/publication/KarreR15},
cites = {0},
citedby = {0},
pages = {110-117},
booktitle = {ENASE 2015 - Proceedings of the 10th International Conference on Evaluation of Novel Approaches to Software Engineering, Barcelona, Spain, 29-30 April, 2015},
editor = {Joaquim Filipe and Leszek A. Maciaszek},
publisher = {SciTePress},
isbn = {978-989-758-100-7},
}