Ravi Kasaudhan, Sung Y. Shin, Soon-Ik Jeon, Seong-Ho Son. Similarity measurement with combination of mesh distance fourier transform and global features in 2D binary image. In Sascha Ossowski, editor, Proceedings of the 31st Annual ACM Symposium on Applied Computing, Pisa, Italy, April 4-8, 2016. pages 2176-2181, ACM, 2016. [doi]
Abstract is missing.