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Test system of the time-over-threshold based chip optimized for linear transfer characteristics and low power for particle tracking applications

Krzysztof Kasinski, Rafal Kleczek. Test system of the time-over-threshold based chip optimized for linear transfer characteristics and low power for particle tracking applications. In 22nd International Conference Mixed Design of Integrated Circuits & Systems, MIXDES 2015, Torun, Poland, June 25-27, 2015. pages 390-395, IEEE, 2015. [doi]

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Krzysztof Kasinski

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Rafal Kleczek

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