Test system of the time-over-threshold based chip optimized for linear transfer characteristics and low power for particle tracking applications

Krzysztof Kasinski, Rafal Kleczek. Test system of the time-over-threshold based chip optimized for linear transfer characteristics and low power for particle tracking applications. In 22nd International Conference Mixed Design of Integrated Circuits & Systems, MIXDES 2015, Torun, Poland, June 25-27, 2015. pages 390-395, IEEE, 2015. [doi]

@inproceedings{KasinskiK15-0,
  title = {Test system of the time-over-threshold based chip optimized for linear transfer characteristics and low power for particle tracking applications},
  author = {Krzysztof Kasinski and Rafal Kleczek},
  year = {2015},
  doi = {10.1109/MIXDES.2015.7208549},
  url = {http://dx.doi.org/10.1109/MIXDES.2015.7208549},
  researchr = {https://researchr.org/publication/KasinskiK15-0},
  cites = {0},
  citedby = {0},
  pages = {390-395},
  booktitle = {22nd International Conference Mixed Design of Integrated Circuits & Systems, MIXDES 2015, Torun, Poland, June 25-27, 2015},
  publisher = {IEEE},
  isbn = {978-8-3635-7807-7},
}