Fernanda Lima Kastensmidt, Jorge Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost. Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-2, IEEE, 2014. [doi]
Abstract is missing.