Tetsuro Katayama, Futa Hirakoba, Yoshihiro Kita, Hisaaki Yamaba, Kentaro Aburada, Naonobu Okazaki. Application of Pairwise Testing into BWDM which is a Test Case Generation Tool for the VDM++ Specification. JRNAL, 6(3):143-147, 2019. [doi]
@article{KatayamaHKYAO19,
title = {Application of Pairwise Testing into BWDM which is a Test Case Generation Tool for the VDM++ Specification},
author = {Tetsuro Katayama and Futa Hirakoba and Yoshihiro Kita and Hisaaki Yamaba and Kentaro Aburada and Naonobu Okazaki},
year = {2019},
doi = {10.2991/jrnal.k.191202.001},
url = {https://doi.org/10.2991/jrnal.k.191202.001},
researchr = {https://researchr.org/publication/KatayamaHKYAO19},
cites = {0},
citedby = {0},
journal = {JRNAL},
volume = {6},
number = {3},
pages = {143-147},
}