Lukas Kathrein, Kristof Meixner, Dietmar Winkler 0001, Arndt Lüder, Stefan Biffl. Extending the Formal Process Description towards Consistency in Product/ion-Aware Modeling. In 24th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2019, Zaragoza, Spain, September 10-13, 2019. pages 679-686, IEEE, 2019. [doi]
Abstract is missing.