Hiroya Kato, Seira Hidano, Takao Murakami, Hideitsu Hino. Enhancing Certified Robustness in Few-Shot Classification with Contrastive Loss and Defensive Noise in Fine-Tuning. In Roberto Di Pietro, Karen Renaud, Paolo Mori, editors, Proceedings of the 12th International Conference on Information Systems Security and Privacy, ICISSP 2026, Marbella, Spain, March 4-6, 2026, Volume 2. pages 169-180, SCITEPRESS, 2026. [doi]
Abstract is missing.