Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices

Kentaroh Katoh, Hideo Ito. Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices. In 11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK. pages 69-74, IEEE Computer Society, 2006. [doi]

Authors

Kentaroh Katoh

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Hideo Ito

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