Kentaroh Katoh, Hideo Ito. Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices. In 11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK. pages 69-74, IEEE Computer Society, 2006. [doi]
@inproceedings{KatohI06,
title = {Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices},
author = {Kentaroh Katoh and Hideo Ito},
year = {2006},
doi = {10.1109/ETS.2006.10},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2006.10},
tags = {testing},
researchr = {https://researchr.org/publication/KatohI06},
cites = {0},
citedby = {0},
pages = {69-74},
booktitle = {11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK},
publisher = {IEEE Computer Society},
isbn = {0-7695-2566-0},
}