An Impact Localization Solution Using Embedded Intelligence - Methodology and Experimental Verification via a Resource-Constrained IoT Device

Ioannis Katsidimas, Vassilis Kostopoulos, Thanasis Kotzakolios, Sotiris E. Nikoletseas, Stefanos H. Panagiotou, Constantinos Tsakonas. An Impact Localization Solution Using Embedded Intelligence - Methodology and Experimental Verification via a Resource-Constrained IoT Device. Sensors, 23(2):896, January 2023. [doi]

Abstract

Abstract is missing.