Yuri V. Katunin, Vladimir Ya. Stenin. The Fault Tolerant CMOS Logical C-Element for Digital Devices Resistant to Single Nuclear Particles. In 2019 IEEE East-West Design & Test Symposium, EWDTS 2019, Batumi, Georgia, September 13-16, 2019. pages 1-4, IEEE, 2019. [doi]
@inproceedings{KatuninS19,
title = {The Fault Tolerant CMOS Logical C-Element for Digital Devices Resistant to Single Nuclear Particles},
author = {Yuri V. Katunin and Vladimir Ya. Stenin},
year = {2019},
doi = {10.1109/EWDTS.2019.8884458},
url = {https://doi.org/10.1109/EWDTS.2019.8884458},
researchr = {https://researchr.org/publication/KatuninS19},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2019 IEEE East-West Design & Test Symposium, EWDTS 2019, Batumi, Georgia, September 13-16, 2019},
publisher = {IEEE},
isbn = {978-1-7281-1003-5},
}