Yuri V. Katunin, Vladimir Ya. Stenin. The Fault Tolerant CMOS Logical C-Element for Digital Devices Resistant to Single Nuclear Particles. In 2019 IEEE East-West Design & Test Symposium, EWDTS 2019, Batumi, Georgia, September 13-16, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.