Yuri V. Katunin, Vladimir Ya. Stenin. Modelling Error Pulses in a CMOS Triple Majority Gate while Exposed to an Ionizing Particle. In IEEE East-West Design & Test Symposium, EWDTS 2020, Varna, Bulgaria, September 4-7, 2020. pages 1-4, IEEE, 2020. [doi]
@inproceedings{KatuninS20,
title = {Modelling Error Pulses in a CMOS Triple Majority Gate while Exposed to an Ionizing Particle},
author = {Yuri V. Katunin and Vladimir Ya. Stenin},
year = {2020},
doi = {10.1109/EWDTS50664.2020.9224697},
url = {https://doi.org/10.1109/EWDTS50664.2020.9224697},
researchr = {https://researchr.org/publication/KatuninS20},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE East-West Design & Test Symposium, EWDTS 2020, Varna, Bulgaria, September 4-7, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9899-6},
}