Yuri V. Katunin, Vladimir Ya. Stenin. Modelling Error Pulses in a CMOS Triple Majority Gate while Exposed to an Ionizing Particle. In IEEE East-West Design & Test Symposium, EWDTS 2020, Varna, Bulgaria, September 4-7, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.