Baljit Kaur, Sandeep Miryala, S. K. Manhas, Bulusu Anand. An efficient method for ECSM characterization of CMOS inverter in nanometer range technologies. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 665-669, IEEE, 2013. [doi]
@inproceedings{KaurMMA13,
title = {An efficient method for ECSM characterization of CMOS inverter in nanometer range technologies},
author = {Baljit Kaur and Sandeep Miryala and S. K. Manhas and Bulusu Anand},
year = {2013},
doi = {10.1109/ISQED.2013.6523681},
url = {http://dx.doi.org/10.1109/ISQED.2013.6523681},
researchr = {https://researchr.org/publication/KaurMMA13},
cites = {0},
citedby = {0},
pages = {665-669},
booktitle = {International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013},
publisher = {IEEE},
isbn = {978-1-4673-4951-2},
}