Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Emmanouil Kalligeros, Vasileios Tenentes. Defect Coverage-Driven Window-Based Test Compression. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 141-146, IEEE Computer Society, 2010. [doi]
Abstract is missing.