A built-in self-repair analyzer (CRESTA) for embedded DRAMs - researchr publication authors

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Tomoya Kawagoe, Jun Ohtani, Mitsutaka Niiro, Tukasa Ooishi, Mitsuhiro Hamada, Hideto Hidaka. A built-in self-repair analyzer (CRESTA) for embedded DRAMs. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 567-574, IEEE Computer Society, 2000.

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