Fabric Defect Detection System using YOLO - researchr publication authors

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Masashi Kawaguchi, Yuta Morimitsu, Ryusei Watanabe, Chihiro Ikuta, Naohiro Ishii, Masayoshi Umeno. Fabric Defect Detection System using YOLO. In 14th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2023, Koriyama, Japan, July 8-13, 2023. pages 277-280, IEEE, 2023. [doi]

This author has not been identified. Look up 'Masashi Kawaguchi' in GoogleThis author has not been identified. Look up 'Yuta Morimitsu' in GoogleThis author has not been identified. Look up 'Ryusei Watanabe' in GoogleThis author has not been identified. Look up 'Chihiro Ikuta' in GoogleThis author has not been identified. Look up 'Naohiro Ishii' in GoogleThis author has not been identified. Look up 'Masayoshi Umeno' in Google

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