Masashi Kawaguchi, Yuta Morimitsu, Ryusei Watanabe, Chihiro Ikuta, Naohiro Ishii, Masayoshi Umeno. Fabric Defect Detection System using YOLO. In 14th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2023, Koriyama, Japan, July 8-13, 2023. pages 277-280, IEEE, 2023. [doi]
Abstract is missing.