Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique

C. Kawahara, Y. Wada, S. Kinouchi, H. Kobayashi. Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique. Microelectronics Reliability, 88:957-960, 2018. [doi]

Authors

C. Kawahara

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Y. Wada

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S. Kinouchi

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H. Kobayashi

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