Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique

C. Kawahara, Y. Wada, S. Kinouchi, H. Kobayashi. Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique. Microelectronics Reliability, 88:957-960, 2018. [doi]

Abstract

Abstract is missing.