Error Metric Using Correlation Between Binocular Corneal Images

Natsuki Kawakami, Kentaro Takemura. Error Metric Using Correlation Between Binocular Corneal Images. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023. pages 5140-5145, IEEE, 2023. [doi]

Authors

Natsuki Kawakami

This author has not been identified. Look up 'Natsuki Kawakami' in Google

Kentaro Takemura

This author has not been identified. Look up 'Kentaro Takemura' in Google