Natsuki Kawakami, Kentaro Takemura. Error Metric Using Correlation Between Binocular Corneal Images. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023. pages 5140-5145, IEEE, 2023. [doi]
Abstract is missing.