Atsushi Kawasumi, Yasuhisa Takeyama, Osamu Hirabayashi, Keiichi Kushida, Fumihiko Tachibana, Yusuke Niki, Shinichi Sasaki, Tomoaki Yabe. Energy efficiency deterioration by variability in SRAM and circuit techniques for energy saving without voltage reduction. In IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012. pages 1-4, IEEE, 2012. [doi]
@inproceedings{KawasumiTHKTNSY12-0,
title = {Energy efficiency deterioration by variability in SRAM and circuit techniques for energy saving without voltage reduction},
author = {Atsushi Kawasumi and Yasuhisa Takeyama and Osamu Hirabayashi and Keiichi Kushida and Fumihiko Tachibana and Yusuke Niki and Shinichi Sasaki and Tomoaki Yabe},
year = {2012},
doi = {10.1109/ICICDT.2012.6232859},
url = {http://dx.doi.org/10.1109/ICICDT.2012.6232859},
researchr = {https://researchr.org/publication/KawasumiTHKTNSY12-0},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012},
publisher = {IEEE},
isbn = {978-1-4673-0146-6},
}