Design of an FPGA-based RRAM parameter measurement platform

Z. E. Kaya, S. B. Tekin, S. Kalem. Design of an FPGA-based RRAM parameter measurement platform. In IEEE International Conference on Industrial Technology, ICIT 2018, Lyon, France, February 20-22, 2018. pages 1407-1411, IEEE, 2018. [doi]

Abstract

Abstract is missing.