Scanning electron microscope-based stereo analysis

Ali Kayaalp, A. Ravishankar Rao, Ramesh Jain. Scanning electron microscope-based stereo analysis. Mach. Vis. Appl., 3(4):231-246, 1990. [doi]

Authors

Ali Kayaalp

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A. Ravishankar Rao

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Ramesh Jain

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