Ali Kayaalp, A. Ravishankar Rao, Ramesh Jain. Scanning electron microscope-based stereo analysis. Mach. Vis. Appl., 3(4):231-246, 1990. [doi]
@article{KayaalpRJ90,
title = {Scanning electron microscope-based stereo analysis},
author = {Ali Kayaalp and A. Ravishankar Rao and Ramesh Jain},
year = {1990},
doi = {10.1007/BF01211849},
url = {http://dx.doi.org/10.1007/BF01211849},
tags = {rule-based, analysis},
researchr = {https://researchr.org/publication/KayaalpRJ90},
cites = {0},
citedby = {0},
journal = {Mach. Vis. Appl.},
volume = {3},
number = {4},
pages = {231-246},
}