Ghaith Kazma, Ghaith Bany Hamad, Otmane Aït Mohamed, Yvon Savaria. Analysis of SEU Propagation in Combinational Circuits at RTL Based on Satisfiability Modulo Theories. In Laleh Behjat, Jie Han, Miroslav N. Velev, Deming Chen, editors, Proceedings of the on Great Lakes Symposium on VLSI 2017, Banff, AB, Canada, May 10-12, 2017. pages 239-244, ACM, 2017. [doi]
@inproceedings{KazmaHMS17,
title = {Analysis of SEU Propagation in Combinational Circuits at RTL Based on Satisfiability Modulo Theories},
author = {Ghaith Kazma and Ghaith Bany Hamad and Otmane Aït Mohamed and Yvon Savaria},
year = {2017},
doi = {10.1145/3060403.3060438},
url = {http://doi.acm.org/10.1145/3060403.3060438},
researchr = {https://researchr.org/publication/KazmaHMS17},
cites = {0},
citedby = {0},
pages = {239-244},
booktitle = {Proceedings of the on Great Lakes Symposium on VLSI 2017, Banff, AB, Canada, May 10-12, 2017},
editor = {Laleh Behjat and Jie Han and Miroslav N. Velev and Deming Chen},
publisher = {ACM},
isbn = {978-1-4503-4972-7},
}