Minhui Ke, Ying Zhang, Jianhui Jiang. High-level Fault Diagnosis on network-on-chip using path tracking. In 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. pages 1-4, IEEE, 2017. [doi]
@inproceedings{KeZJ17, title = {High-level Fault Diagnosis on network-on-chip using path tracking}, author = {Minhui Ke and Ying Zhang and Jianhui Jiang}, year = {2017}, doi = {10.1109/VLSI-DAT.2017.7939650}, url = {https://doi.org/10.1109/VLSI-DAT.2017.7939650}, researchr = {https://researchr.org/publication/KeZJ17}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017}, publisher = {IEEE}, isbn = {978-1-5090-3969-2}, }