Minhui Ke, Ying Zhang, Jianhui Jiang. High-level Fault Diagnosis on network-on-chip using path tracking. In 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. pages 1-4, IEEE, 2017. [doi]
Abstract is missing.