Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL

David C. Keezer, C. Gray, A. M. Majid, N. Taher. Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 152-157, IEEE Computer Society, 2005. [doi]

Abstract

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