I. Kehayova, P. Malinov, Vladimir Valkanov, Emil Doychev. Architecture of a module for analyzing electronic test results. In Ronald R. Yager, Vassil Stoyanov Sgurev, Mincho Hadjiski, Vladimir Simov Jotsov, editors, 8th IEEE International Conference on Intelligent Systems, IS 2016, Sofia, Bulgaria, September 4-6, 2016. pages 784-788, IEEE, 2016. [doi]
Abstract is missing.