Martin Keim, Nicole Drechsler, Bernd Becker. Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. In Proceedings of the 1999 Conference on Asia South Pacific Design Automation, January 18-21, 1999, Wanchai, Hong Kong. pages 315-318, IEEE, 1999. [doi]
@inproceedings{KeimDB99,
title = {Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits},
author = {Martin Keim and Nicole Drechsler and Bernd Becker},
year = {1999},
url = {http://csdl.computer.org/comp/proceedings/asp-dac/1999/2329/00/23290315abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/KeimDB99},
cites = {0},
citedby = {0},
pages = {315-318},
booktitle = {Proceedings of the 1999 Conference on Asia South Pacific Design Automation, January 18-21, 1999, Wanchai, Hong Kong},
publisher = {IEEE},
}