Andrew Keller, Jared Anderson, Michael J. Wirthlin, Shi-Jie Wen, Rita Fung, Conner Chambers. Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{KellerAWWFC20,
title = {Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System},
author = {Andrew Keller and Jared Anderson and Michael J. Wirthlin and Shi-Jie Wen and Rita Fung and Conner Chambers},
year = {2020},
doi = {10.1109/IRPS45951.2020.9128839},
url = {https://doi.org/10.1109/IRPS45951.2020.9128839},
researchr = {https://researchr.org/publication/KellerAWWFC20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3199-3},
}