Fabian Keller, Lars Grunske, Simon Heiden, Antonio Filieri, André van Hoorn, David Lo. A Critical Evaluation of Spectrum-Based Fault Localization Techniques on a Large-Scale Software System. In 2017 IEEE International Conference on Software Quality, Reliability and Security, QRS 2017, Prague, Czech Republic, July 25-29, 2017. pages 114-125, IEEE, 2017. [doi]
Abstract is missing.