Brion L. Keller, David A. Haynes. Design Automation of Test for the EX/9000:::TM::: Series Processors. In Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, ICCD 91, Cambridge, MA, USA, October 14-16, 1991. pages 550-553, IEEE Computer Society, 1991.
Abstract is missing.