An Economic Analysis and ROI Model for Nanometer Test - researchr publication authors

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Brion L. Keller, Mick Tegethoff, Thomas Bartenstein, Vivek Chickermane. An Economic Analysis and ROI Model for Nanometer Test. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 518-524, IEEE, 2004. [doi]

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