Tobias Kemmer, Michael Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner, Helmer Konstanzer, Rüdiger Quay, Oliver Ambacher. Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and Off-State Stress. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{KemmerDBPBKQA20,
title = {Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and Off-State Stress},
author = {Tobias Kemmer and Michael Dammann and Martina Baeumler and Vladimir Polyakov and Peter Brückner and Helmer Konstanzer and Rüdiger Quay and Oliver Ambacher},
year = {2020},
doi = {10.1109/IRPS45951.2020.9128308},
url = {https://doi.org/10.1109/IRPS45951.2020.9128308},
researchr = {https://researchr.org/publication/KemmerDBPBKQA20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3199-3},
}