Roland Kempf, Yuichi Kurita, Yoshichika Iida, Makoto Kaneko, Hiromu K. Mishima, Hidetoshi Tsukamoto, Eiichiro Sugimoto. Understanding eye deformation in non-contact tonometry. In 28th International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2006, New York City, NY, USA, August 30 - September 3, 2006, Main Volume. pages 5428-5431, IEEE, 2006. [doi]
Abstract is missing.